Dataray光束質(zhì)量分析,光斑分析,M2光束分析系統
美國 DataRay 公司提供激光光束分析儀器,對激光光束的光斑大小,形狀和能量分布等參數進(jìn)行全面的測試和分析;同時(shí)與個(gè)人電腦連接對分析的結果提供二維或三維的顯示,并對分析的結果進(jìn)行打印輸出。適合各種各樣的激光光束,幫助你對你的激光光束的品質(zhì)提供一個(gè)量化的結果。
產(chǎn)品分為:
相機式光束質(zhì)量分析儀(CCD式) Beam Profiling Cameras
狹縫掃描式光束質(zhì)量分析儀 Slit Scan Beam Profilers
查看Dataray光束質(zhì)量分析儀的選擇向導
相機式光束質(zhì)量分析儀(CCD式)
Beam Profiling Cameras
WinCamD系列
WinCamD-UCD12 |
WinCamD-UCD15 |
WinCamD-UCD23 |
WinCamD-UHR |
WinCamD-XHR |
WinCamD-FIR-HR |
WinCamD-LCM |
BladeCam-HR和BladeCam-XHR系列
BladeCam-XHR
System-BladeCam-XHR
|
BladeCam-XHR-1310
System-BladeCam-XHR-1310
|
BladeCam-XHR-UV
System-BladeCam-XHR-UV
|
BladeCam-XHR
System-BladeCam-XHR |
BladeCam-XHR-1310
System-BladeCam-XHR-1310 |
BladeCam-XHR-UV
System-BladeCam-XHR-UV |
TaperCamD-UCD12和TaperCamD20-15-UCD23系列
TaperCamD-UCD12
System-TaperCamD-UCD12
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TaperCamD-UCD12-1310
System-TaperCamD-UCD12-1310
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TaperCamD-UCD12-NIR
System-TaperCamD-UCD12-NIR
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TaperCamD20-15-UCD23
System-TaperCamD20-15-UCD23
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TaperCamD20-15-UCD23-1310
System-TaperCamD20-15-UCD23-1310
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TaperCamD20-15-UCD23-NIR
System-TaperCamD20-15-UCD23-NIR
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相機式光束質(zhì)量分析儀附件
Filters/Samplers/Attenuators |
Lenses/Optics |
Translation Stages/Hardware |
UV/IR Converters |
Replacement Detectors |
Replacement Cables |
Manuals |
狹縫掃描式光束質(zhì)量分析儀
Slit Scan Beam Profilers
Beam'R2系列
Beam'R2-S
System-BR2-Si
|
Beam'R2-InGaAs
System-BR2-IGA
|
Beam'R2-DD Si/InGaAs (190-1750 nm)
System-BR2-DD
|
Beam'R2-DD Si/InGaAs (190-2300 nm)
System-BR2-DD-2300
|
Beam'R2-DD Si/InGaAs (190-2500 nm)
System-BR2-DD-2500
|
BeamMap2 4XY/3XYKE系列
BeamMap2-4XY-Si
System-BMS2-4XY-Si
|
BeamMap2-4XY-InGaAs
System-BMS2-4XY-IGA
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BeamMap2-4XY-DD Si/InGaAs
System-BMS2-4XY-DD
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BeamMap2-3XYKE-Si
System-BMS2-3XYKE-Si
|
BeamMap2-3XYKE-InGaAs
System-BMS2-3XYKE-IGA
|
BeamMap2-3XYKE-DD Si/InGaAs
System-BMS2-3XYKE-DD
|
BeamMap2 ColliMate系列
BeamMap2-CM4-Si System-BMS2-CM4-Si
|
BeamMap2-CM4-InGaAs>
System-BMS2-CM4-IGA
|
BeamMap2-CM4-DD Si/InGaAs
System-BMS2-CM4-DD
|
BeamMap2-CM3-Si
System-BMS2-CM3-Si
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BeamMap2-CM3-InGaAs
System-BMS2-CM3-IGA
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BeamMap2-CM3-DD Si/InGaAs
System-BMS2-CM3-DD
|
BeamScope-P8 系列
BeamScope-P8-Si
System-BSC-P8-Si
|
BeamScope-P8-Ge
System-BSC-P8-Ge
|
BeamScope-P8-InAs
System-BSC-P8-IA
|
BeamScope-P8-Si, extended probe head
System-BSC-P8-Si-EPH
|
BeamScope-P8-Ge, extended probe head
System-BSC-P8-Ge-EPH
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BeamScope-P8-InAs, extended probe head
System-BSC-P8-IA-EPH
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狹縫掃描式光束質(zhì)量分析儀附件
Samplers/Attenuators |
Lenses/Optics> |
Translation Stages/Hardware |
BeamScope Slits/Pinholes |
True2D Sapphire Slits |
Replacement Cables |
Manuals |
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